LA9300AD enables detection of shallow microscopic defects, contributing to reduced manufacturing costs and improved yield.

The GT2000 is designed to meet the needs of semiconductor devices development and mass production in High-NA EUV generation.

DI4600 systems are installed and running as in-line defect management tools in cutting-edge memory and logic semiconductor fabs.

Pursuing improved sensitivity when measuring physical properties and measurement at atomic and molecular scales.

Helping to improve the reliability and safety of semiconductor devices in the IoT and automotive fields. Hitachi High-Tech Corporation has announced the launch of the Hitachi Dark Field Wafer Defect Inspection System DI2800, a critical component in any semiconductor manufacturer's metrology capabilities.

An AD ECU* capable of updating vehicle control software and an OTA Unit that receives and manages update data, both developed by Hitachi Astemo, Ltd. as "over-the-air (OTA) software update solutions", have been adopted by the new model Honda Legend, which is equipped with a traffic jam pilot function that achieves Automated Driving Level 3 and was released in March by Honda Motor Co., Ltd. (President and Representative Director: Toshihiro Mibe).

Go on sale after July as the service that contributes to new workstyle in the New Normal with supporting remote working, operational efficiency and cost reduction.