Keysight Introduces Compact XG7-Class Dual-Channel Analog Signal Generator

Keysight Technologies has introduced the new PSG XG7-class analog signal generator. The system delivers frequencies of up to 20 gigahertz (GHz) and combines two fully independent channels in a compact 2U high enclosure. The solution is primarily aimed at demanding test environments in aerospace, defense, and high-speed digital components, where both physical rack space and absolute signal quality are critical factors.

Ultra-Low Phase Noise and High Output Power
In high-precision applications, the noise of the signal source can mask the actual behavior of the device under test (DUT). The new PSG solves this measurement challenge with exceptionally low noise levels: it offers phase noise of -135 dBc/Hz and amplitude modulation noise of -150 dBc/Hz (each measured at 10 GHz with a 10 kHz offset), alongside a broadband noise floor of -166 dBc/Hz. Furthermore, a calibrated output power of up to +22 dBm ensures that the exact required signal level reaches the device under test—even when highly lossy cables and test fixtures are used during measurement. The system architecture also enables rapid technology upgrades through full SCPI (Standard Commands for Programmable Instruments) compatibility, allowing existing test automation routines to be reused without modification.

Additional Context: Technological Background and Market Dynamics
This section provides technological background not detailed in the original release.

In automated test equipment (ATE) used in semiconductor manufacturing or radar validation, space in 19-inch racks is extremely premium and limited (a standard rack typically provides 42 rack units). A single rack unit (1U) equals 1.75 inches. By integrating two independent 20 GHz signal sources into a single 2U enclosure, Keysight doubles the channel density. This allows engineers to house more test channels in the same rack or free up space for complementary instruments such as network analyzers (VNAs) or environmental test chambers.

The exceptionally low phase noise (-135 dBc/Hz) is especially essential for developing modern radio and radar systems. Phase noise refers to small, unwanted fluctuations in the phase of a signal. When a signal generator is used to test high-resolution analog-to-digital converters (ADCs) or complex modulation schemes like QAM (Quadrature Amplitude Modulation), the generator's noise adds to that of the device under test. A high-phase-noise generator would "smear" the measurement (increasing Error Vector Magnitude - EVM), causing a properly functioning chip to fail the test. The XG7 pushes this baseline noise low enough to ensure engineers are measuring the true performance of their device alone.

Edited by industrial journalist Lekshman Ramdas, with AI assistance.

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