AMETEK EDAX, a leader in X-ray microanalysis and electron diffraction instrumentation, is adding a new, fast, low-noise CMOS camera to its Velocity Electron Backscatter Diffraction (EBSD) Camera Series.
The Velocity Pro offers high-speed EBSD mapping with the highest indexing performance on real-world materials. The Velocity EBSD Camera Series now includes three cameras tailored to specific EBSD analysis applications:
- Velocity Pro – Collects up to 2,000 indexed points per second
- Velocity Plus – Collects up to 3,000 indexed points per second
- Velocity Super – Collects up to 4,500 indexed points per second
Powered by a CMOS sensor optimized for high-speed EBSD, the Velocity EBSD Camera Series combines indexing speeds up to 4,500 indexed points per second with indexing success rates of 99% or better. At these speeds, the Velocity Cameras use 120 x 120 pixel EBSD patterns for improved band detection. This image resolution, combined with the proven EDAX Triplet Indexing routine, provides orientation precision values of less than 0.1°.
The Velocity EBSD Series can be integrated with compatible EDAX EDS detectors to provide an analytical system for efficient simultaneous EDS-EBSD collection, even at the highest collection speeds. Furthermore, the collection can be combined with ChI-Scan analysis for results with useful, integrated data for accurate phase differentiation.
This new addition to the EDAX portfolio of EBSD cameras offers users another option for high-speed mapping and accurate indexing to resolve crystallographic microstructures and help solve materials characterization challenges quickly and easily.