ZEISS Applies Artificial Intelligence to 3D X-ray Microscope Reconstruction Technologies

Up to 10x higher throughput plus even better image quality with new DeepRecon Pro and PhaseEvolve modules from ZEISS.

Two new reconstruction technologies introduced today by ZEISS use Artificial Intelligence (AI) to improve data collection and analysis, and speed up decision-making significantly. Now available for the Advanced Reconstruction Toolkit (ART) on ZEISS Xradia 3D X-ray platforms, ZEISS DeepRecon Pro and ZEISS PhaseEvolve modules increase throughput by up to 10x while producing better than ever image quality.

They’re designed for research fields including geosciences, pharmaceuticals, electronics, battery and engineering materials as well as for semiconductor failure analysis.

ZEISS ART gives researchers continuous access to the latest technologies for reconstruction, providing flexible workflow strategies as their imaging needs evolve. The toolbox is based on advancing reconstruction technologies beyond the typical “filtered back projection” or Feldkamp-Davis-Kress (FDK) algorithms.

It enables acquisition and analysis with even fewer projections, reducing scan times by up to 10x, depending on the sample type and size, thus saving a considerable amount of time. These developments offer real benefits to professionals in academic R&D, high technology industry R&D, and industrial quality control & failure analysis laboratories as well as to university shared (core) facilities and mining/oil exploration (economic GEO) test labs.

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