Keysight Introduces Isolated Probing Technology for Fast-Switching Power Device Testing

Keysight Technologies has developed an optically isolated differential probing family dedicated to enhancing efficiency and performance testing of fast-switching devices such as wide bandgap GaN and SiC semiconductors. The new voltage probes will be displayed at Applied Power Electronics Conference (APEC) 2025 in Keysight’s booth (#829) along with Keysight’s MXR B and HD3 series of oscilloscopes.

Validation of floating half-bridge and full-bridge architectures commonly used in power conversion, motor drives, and inverters requires measurement of small differential signals riding on high common-mode voltages. This measurement can be challenging due to voltage source fluctuations relative to ground, noise interference, and safety concerns. Isolated differential probes are galvanically isolated and reject common-mode voltages, enabling power electronics engineers to measure floating circuits accurately and safely in high-voltage, noisy environments. This technology will drive progress in efficiency and switching loss testing for high-voltage applications like electric vehicles (EVs), solar energy, battery management systems, and more.




Keysight’s isolated differential probes provide up to 10 billion times greater common-mode rejection than standard differential probes, making them ideal for high-voltage, high-side measurements. With up to 1 GHz bandwidth and a ±2,500 V differential voltage range, these probes enable accurate analysis of fast-switching GaN and SiC devices.

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