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TOSHIBA LAUNCHES SMALL PHOTORELAY SUITABLE FOR HIGH-FREQUENCY SIGNAL SWITCHES IN SEMICONDUCTOR TESTERS

The new product is suitable for applications such as semiconductor tester pin electronics, which use a large number of relays and require high-speed signal transmission.

TOSHIBA LAUNCHES SMALL PHOTORELAY SUITABLE FOR HIGH-FREQUENCY SIGNAL SWITCHES IN SEMICONDUCTOR TESTERS

Toshiba Electronic Devices & Storage Corporation has launched "TLP3475W," a photorelay in a small, thin WSON4 package. It reduces insertion loss and suppresses power attenuation in high-frequency signals and is suitable for the pin electronics of semiconductor testers, which use a large number of relays and require high-speed signalling.

Toshiba’s optimized package design reduces parasitic capacitance and inductance in the new photorelay. This reduces insertion loss and improves the transmission characteristic of high-frequency signals to 20GHz (typ.), about 1.5 times lower than Toshiba’s current product, TLP3475S.

TLP3475W uses a small, thin WSON4 package that is only 0.8mm (typ.) thick, making it the smallest photorelay in the industry to realize improved high-frequency signal transmission characteristics. It is 40% lower in height than Toshiba’s ultra-small S-VSON4T package, allowing more products to be mounted on the same circuit board, and will contribute to improved measuring efficiency.

Applications
  • Semiconductor testers (high-speed memory testers, high-speed logic testers, etc.)
  • Probe cards
  • Measuring equipment
Features
  • Industry’s smallest WSON4 package: 1.45mm×2.0mm (typ.), t=0.8mm (typ.)
  • Improving to pass the high-frequency signals: f=20GHz (typ.) @Insertion loss(S21) = -3dB
  • Normally open function (1-Form-A)

www.toshiba.semicon-storage.com

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