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Mediatek News
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innodisk
Innodisk Achieves IEC 62443-4-1 Certification
The certification validates Innodisk’s secure development lifecycle across its full product portfolio, aligning its edge AI and industrial solutions with international cybersecurity and regulatory requirements.
16
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Fraunhofer News
Fraunhofer IPMS develops chips for organic semiconductor characterization
New interdigital electrode chips enable parallel, high-precision material testing, accelerating development of organic electronic devices and sensor technologies.
16
'26
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Microchip News
28 nm embedded flash reaches automotive Grade 1 production
Silicon Storage Technology and United Microelectronics Corporation qualify SuperFlash Gen 4 eNVM for safety-critical automotive controllers on UMC’s 28HPC+ process.
16
'26
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Omron Components News
Miniature MOSFET relays target high-speed test systems
OMRON Components Europe has introduced ultra-compact G3VM MOSFET relays designed for high-density, high-speed switching in test and measurement equipment.
15
'26
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OMRON News
Miniature MOSFET relays target high-speed test switching
OMRON expands its G3VM range with 20 V and 40 V parts designed to reduce capacitance, leakage, and switching delays in high-channel ATE.
15
'26
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Northrop Grumman News
Accelerated Radiation Testing for Microelectronics
Northrop Grumman demonstrates compact radiation-testing technology under DARPA program to shorten qualification cycles for space and nuclear microelectronics.
15
'26
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Vishay News
Vishay expands 193 PUR-SI snap-in capacitors with 550 V and 600 V ratings
Higher voltage headroom reduces component count, saves space, and improves DC-link reliability.
15
'26
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Mitsubishi Electric News
Mitsubishi Electric samples new trench SiC-MOSFET bare dies
Mitsubishi Electric introduces four trench SiC-MOSFET bare dies for embedded power electronics, targeting lower losses and stable performance in EV inverters, chargers and renewable energy systems.
15
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Microchip News
