23
'25
Written on
ADLINK News
23
'25
Written on
Toshiba News
Toshiba Launches New Power MOSFETs
Toshiba's new 80V and 150V MOSFETs achieve ~21% lower on-resistance and ~15% lower thermal resistance compared to existing models.
23
'25
Written on
NXP News
NXP Introduces Robust MCX E Series for Safety
MCX E24 supports harsh electrical environments with 2.7-5.5V operation, -40°C to 125°C rating, 24/7 uptime, and a 10-year life cycle.
23
'25
Written on
Anritsu News
Anritsu Introduces Advanced 5G Device Test Solution
The 1024QAM modulation for downlink offers approximately 25% improvement in data throughput compared to the current 256QAM standard.
22
'25
Written on
Mitutoyo Europe
EMO PRE-SHOW PRESS RELEASE
Mitutoyo to Showcase Cutting-Edge Metrology Solutions at EMO 2025 in Hannover Next-Gen Measurement for Next-Level Manufacturing.
22
'25
Written on
HighTec News
HighTec and Elektrobit Pioneer Rust Integration in AUTOSAR Classic
HighTec and Elektrobit launch Rust tools for Infineon’s Drive Core, streamlining AUTOSAR Classic ECU development on AURIX TC4x microcontrollers.
21
'25
Written on
Sensata Technologies News
Sensata Technologies Launches High Efficiency Contactor for Seamless 400V/800V EV Charging
Breakthrough HEC design cuts system components by 50%, boosts safety and efficiency, and enables flexible battery configurations for next-gen electric vehicles.
21
'25
Written on
NeoCortec News
NeoCortec to Showcase NeoMesh with LoRa Modulation at The Things Conference 2025
Demo, presentation, and workshop highlight the power of combining NeoMesh scalability with LoRa’s robust performance.
18
'25
Written on
Fraunhofer News
Fraunhofer IPMS and DIVE Optimize Semiconductor Processes with Cutting-Edge Measurement System
Fraunhofer IPMS and DIVE have installed an optical measuring device that reduces inspection efforts during wafer production and enables more sustainable semiconductor manufacturing.
18
'25
Written on
Bihl + Wiedemann News
