ComAp announces a new generation of its bestselling paralleling gen-set controller, InteliGen4 200. This successor to the InteliGen 200 keeps all the InteliGen 200‘s key features but enhances them focusing on three key areas: cyber security, remote communication, and additional flexibility and efficiency for application design.
SK hynix and Solidigm jointly introduced their first collaborative product, a new enterprise solid-state drive (eSSD), P5530. This limited release product highlights the emerging partnership between SK hynix and Solidigm, which formed three months ago when SK hynix acquired Intel’s NAND and SSD business.
Flex Power Modules has added to its PKU-D series of low-profile sixteenth-brick DC-DC converters with the PKU3913D, a 100 W rated part with an extended input range down to 30 V and regulated output of 12 V/8.3 A.
STMicroelectronics’ L9908 integrated automotive three-phase gate driver unit (GDU) operates in 12V, 24V, or 48V systems and has flexible input and output channels to fulfil numerous applications in conventional and hybrid/electric vehicles.
Panduit Corp. releases SmartZone Uninterruptible Power Supply (UPS), delivering highly efficient and reliable power that provides protection and backup power for your computer IT equipment. SmartZone offers excellent electrical performance, intelligent battery management and long lifespan (lithium-ion units), enhanced intelligent monitoring, and network functions.
Innovative solutions for intelligent applications in the areas of Industrial Internet of Things (IIoT) and the Internet of Everything (IoE) are the focus of Rutronik Elektronische Bauelemente GmbH's exhibition stand at Sensor+Test 2022 (May 10-12, 2022).
Pickering Interfaces, the leading supplier of modular signal switching and simulation solutions for electronic test and verification, has introduced new integrated PXI RF matrix modules with a 32x8 topology — representing a 33% increase in matrix density per chassis slot. Compact 4x-724 family enables scalability of high-performance RF switching systems and reduces test cycle duration.