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ams OSRAM News
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Kontron News
Kontron is presenting boards and DIN rail controllers based on i.MX8M Plus at SPS 2024
Artificial intelligence is making its way into devices and control cabinets.
30
'24
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Infineon News
Infineon at Electronica 2024: Solutions for decarbonization and digitalization
Infineon will showcase innovative solutions for clean, safe and smart mobility as well as for green and intelligent living spaces.
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Toshiba News
Toshiba and MIKROE introduce motor driving board streamlining prototyping of automotive applications
Toshiba Electronics Europe GmbH has partnered with MIKROE to integrate its Smart Motor Control Driver IC into the SmartMCD TB9M003FG board, streamlining prototyping phase for automotive applications.
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Anritsu News
Anritsu Achieves GCF Validation for Next Generation eCall Test Cases on LTE and 5G
Anritsu Corporation is proud to announce full support for 5G and LTE Next Generation eCall (NGeCall) validated test cases on its 5G NR Mobile Device Test Platform ME7834NR enabling GCF certification.
29
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Keysight technologies News
Keysight and ADI Partner to Develop GMSL Test Methodology
This partnership aims to enhance technology, improve interoperability, ensure compliance, and standardize test methods for automotive applications.
29
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BAE SYSTEMS News
BAE Systems demonstrates M-Code signal tracking with Increment 2 GNSS receiver powered by Next-Generation ASIC
This technological breakthrough is part of the Military GPS User Equipment Increment 2 Miniature Serial Interface (MSI) program, the result of a $247 million contract received in 2020 from U.S. Space Force Space Systems Command.
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EEPD News
E.E.P.D. presents high performance class embedded NUC SBC based on the AMD Ryzen Embedded 8000 series for AI and ML applications
E.E.P.D., solution partner for customized and standard embedded computer boards and systems based on x86 and ARM, offers the highest AI performance in the smallest space with the PROFIVE® NUCU series.
29
'24
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ZEISS News
ZEISS Launches New Crossbeam 550 Samplefab FIB-SEM
ZEISS has announces the new ZEISS Crossbeam 550 Samplefab, a focused ion beam scanning electron microscope (FIB-SEM) optimized for fully automated preparation of transmission electron microscopy (TEM) samples (lamellae).
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Vecow News
